Lumped Model Analysis of Semiconductor Devices Using the NET-2 Circuit/System Analysis Program

Capability of the NET-2 circuit/system computer program in semiconductor device analysis is presented. Semiconductor devices are described in terms of lumped model networks of user-selected complexity. The basic capability is illustrated through the calculation of electrical and radiation-induced tr...

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Veröffentlicht in:	IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci. NS-19: No. 6, 103-107(Dec 1972) Trans. Nucl. Sci. NS-19: No. 6, 103-107(Dec 1972), 1972-01, Vol.19 (6), p.103-107
Hauptverfasser:	Raymond, J. P., Krebs, M. G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuit analysis Circuit analysis computing Integrated circuit interconnections Ionizing radiation Laboratories MATHEMATICAL MODELS N46300 -Instrumentation-Radiation Effects on Instrument Components, Instruments, or Electronic Systems P-n junctions PHYSICAL RADIATION EFFECTS Radiation effects Radiative recombination SEMICONDUCTOR DEVICES SEMICONDUCTOR DEVICES/radiation effects on, NET-2 circuit/system and analysis program for lumped-model analysis of transient Semiconductor diodes TRANSIENTS
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