Error Modeling of a Fast Digital Integrator for Magnetic Measurements at CERN
A statistical behavioral modeling approach for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on statistical experiment design is exploited in order to avoid unrealistic hypothesis of linearity, optimize simu...
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| creator | Arpaia, P. Inglese, V. Spiezia, G. Tiso, S. |
| description | A statistical behavioral modeling approach for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on statistical experiment design is exploited in order to avoid unrealistic hypothesis of linearity, optimize simulation effort, explore systematically operating conditions, and verify identification and validation uncertainty. An actual case study on the dynamic metrological characterization of a fast digital integrator for high-performance magnetic measurements at European Organization for Nuclear Research (CERN) is presented. |
| doi_str_mv | 10.1109/IMTC.2007.379048 |
| format | Conference Proceeding |
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| ispartof | 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 2007, p.1-6 |
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| subjects | Analog-digital conversion Analog-to-digital converter (ADC) Design optimization Error analysis Instrumentation and measurement Instruments Linearity Magnetic analysis Magnetic variables measurement modeling Statistical analysis statistics Uncertainty |
| title | Error Modeling of a Fast Digital Integrator for Magnetic Measurements at CERN |
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