Error Modeling of a Fast Digital Integrator for Magnetic Measurements at CERN

Error Modeling of a Fast Digital Integrator for Magnetic Measurements at CERN

A statistical behavioral modeling approach for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on statistical experiment design is exploited in order to avoid unrealistic hypothesis of linearity, optimize simu...

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Bibliographische Detailangaben
Hauptverfasser: Arpaia, P., Inglese, V., Spiezia, G., Tiso, S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Analog-digital conversion
Analog-to-digital converter (ADC)
Design optimization
Error analysis
Instrumentation and measurement
Instruments
Linearity
Magnetic analysis
Magnetic variables measurement
modeling
Statistical analysis
statistics
Uncertainty
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Beschreibung
Zusammenfassung:A statistical behavioral modeling approach for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on statistical experiment design is exploited in order to avoid unrealistic hypothesis of linearity, optimize simulation effort, explore systematically operating conditions, and verify identification and validation uncertainty. An actual case study on the dynamic metrological characterization of a fast digital integrator for high-performance magnetic measurements at European Organization for Nuclear Research (CERN) is presented.
ISSN:1091-5281
DOI:10.1109/IMTC.2007.379048