Dielectric Losses in SiC at Millimeter Wavelengths

Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimen...

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Bibliographische Detailangaben
Hauptverfasser:	Dutta, J.M., Guofen Yu, Jones, C.R.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Data analysis Dielectric loss measurement Dielectric losses Dielectric materials Dielectric measurements Loss measurement Millimeter wave measurements Performance evaluation Silicon carbide Wavelength measurement
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Beschreibung
Zusammenfassung:	Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimental results will be presented.
ISSN:	2162-2027
DOI:	10.1109/ICIMW.2006.368619