Effects of different orientation on CdZnTe detectors

Effects of different orientation on CdZnTe detectors

The traditional orientation used for CdZnTe detectors is (111) surface. To improve the single crystal yield and effectively utilize one oven crystal ingot, we tested CdZnTe detector speciality whose (115) orientation was taken as contact surfaces. Through the same processing as that of (111) orienta...

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Bibliographische Detailangaben
Hauptverfasser: Lan Zhang, Yuanjing Li, Weibin Zhu, Zhi Deng, Shaoji Mao, Xiaocui Zheng, Cong Luo, Longxia Li
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Annealing
Crystals
Detectors
Etching
Leakage current
Nuclear and plasma sciences
Ovens
Telephony
Tellurium
Testing
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Beschreibung
Zusammenfassung:The traditional orientation used for CdZnTe detectors is (111) surface. To improve the single crystal yield and effectively utilize one oven crystal ingot, we tested CdZnTe detector speciality whose (115) orientation was taken as contact surfaces. Through the same processing as that of (111) orientation we made three pixel CdZnTe detectors. Their performance were tested and compared with that of (111) orientation CdZnTe detectors. The preliminary results were provided here.
ISSN:1082-3654
2577-0829
DOI:10.1109/NSSMIC.2006.353806