Design and Optimization of nanoCMOS devices using predictive atomistic physics-based process modeling
For the first time, this work shows that the design and optimization of nanoCMOS devices can be achieved from atomistic physics-based process modeling. Remarkable prediction of device characteristics can be obtained even for novel co-implant processes. This extends the strength of TCAD in manufactur...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | For the first time, this work shows that the design and optimization of nanoCMOS devices can be achieved from atomistic physics-based process modeling. Remarkable prediction of device characteristics can be obtained even for novel co-implant processes. This extends the strength of TCAD in manufacturing for future generations of nanoCMOS devices. |
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ISSN: | 0163-1918 2156-017X |
DOI: | 10.1109/IEDM.2006.346790 |