Distributed Genetic Algorithm of Test Generation For Digital Circuits

The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation

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Bibliographische Detailangaben
Hauptverfasser:	Skobtsov, Y.A., El-Khatib, A.I., Ivanov, D.E.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing Circuit faults Circuit simulation Circuit testing Digital circuits distributed calculations Electronics packaging fault simulation genenic algorithms Genetic algorithms Logic testing Parallel processing Sequential circuits test generation
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Beschreibung
Zusammenfassung:	The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation
ISSN:	1736-3705
DOI:	10.1109/BEC.2006.311096