Ruggedness Improvement by Protection

Cellular phone power amplifier transistors have to withstand extreme voltages, temperatures and currents. Requirements on IC and packaging technology are relaxed by using over-voltage and over-temperature protection. To avoid breakdown, protection circuits are used that detect the collector peak vol...

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Hauptverfasser: van Bezooijen, A., de Graauw, A., Ruijs, L., Pramm, S., Chanlo, C., ten Dolle, H.J., van Straten, F., Mahmoudi, R., van Roermund, A.H.M.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:Cellular phone power amplifier transistors have to withstand extreme voltages, temperatures and currents. Requirements on IC and packaging technology are relaxed by using over-voltage and over-temperature protection. To avoid breakdown, protection circuits are used that detect the collector peak voltage and die temperature to limit the output power once a threshold level is crossed. For a supply voltage of 5 V and a nominal output power of 2W, no breakdown is observed for a VSWR of 10 over all phases. For a VSWR of 4 and worst case mismatch phase the maximum die temperature is reduced from 143degC to 112degC when the output power is adaptively reduced from 32.1 dBm to 27.7 dBm
ISSN:1088-9299
2378-590X
DOI:10.1109/BIPOL.2006.311174