Compendia of Radiation Test Results of Integrated Circuits
TID and SEE data was taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed
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| creator | Layton, P. Gilbert, C. Patnaude, E. Williamson, G. Longden, L. Sloan, C. |
| description | TID and SEE data was taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed |
| doi_str_mv | 10.1109/REDW.2006.295462 |
| format | Conference Proceeding |
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| identifier | ISSN: 2154-0519 |
| ispartof | 2006 IEEE Radiation Effects Data Workshop, 2006, p.13-18 |
| issn | 2154-0519 2154-0535 |
| language | eng |
| recordid | cdi_ieee_primary_4077276 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit testing Gold Integrated circuit testing Performance analysis Performance evaluation Pulse width modulation Radiation Single event upset Space technology Space vector pulse width modulation Test Data Voltage |
| title | Compendia of Radiation Test Results of Integrated Circuits |
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