Compendia of Radiation Test Results of Integrated Circuits

TID and SEE data was taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed

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Bibliographische Detailangaben
Hauptverfasser:	Layton, P., Gilbert, C., Patnaude, E., Williamson, G., Longden, L., Sloan, C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit testing Gold Integrated circuit testing Performance analysis Performance evaluation Pulse width modulation Radiation Single event upset Space technology Space vector pulse width modulation Test Data Voltage
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Beschreibung
Zusammenfassung:	TID and SEE data was taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed
ISSN:	2154-0519 2154-0535
DOI:	10.1109/REDW.2006.295462