Heterogeneous parallel yield-driven electromagnetic CAD

Heterogeneous parallel yield-driven electromagnetic CAD

Within an integrated parallel optimization framework, we are able, for the first time, to apply electromagnetic (EM) optimization to the yield-driven design of microstrip circuits of arbitrary geometries. Parallel optimization handles the massive demand on computer resources, due to the large number...

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Bibliographische Detailangaben
Hauptverfasser: Bandler, J.W., Biernacki, R.M., Cai, Q., Chen, S.H., Grobelny, P.A., Swanson, D.G.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit simulation
Computational geometry
Computational modeling
Computer simulation
Concurrent computing
Design automation
Design optimization
Integrated circuit yield
Microstrip
Solid modeling
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Beschreibung
Zusammenfassung:Within an integrated parallel optimization framework, we are able, for the first time, to apply electromagnetic (EM) optimization to the yield-driven design of microstrip circuits of arbitrary geometries. Parallel optimization handles the massive demand on computer resources, due to the large number of designable parameters describing an arbitrary geometry and the large number of simulations involved in yield optimization. Our parallel strategy can be implemented over local and wide area networks supporting heterogeneous workstations.< >
ISSN:0149-645X
2576-7216
DOI:10.1109/MWSYM.1995.406160