A Modification of Lee's Path Connection Algorithm

It is shown that a set of diagnostic tests designed for a redundant circuit under the single-fault assumption is not necessarily a valid test set if a fault occurrence is preceded by the occurrence of some ( undetectable) redundant faults. This is an additional reason ( besides economy) for trying t...

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Veröffentlicht in:IEEE transactions on electronic computers 1967-02, Vol.EC-16 (1), p.97-98
1. Verfasser: Akers, Sheldon B.
Format: Artikel
Sprache:eng
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Zusammenfassung:It is shown that a set of diagnostic tests designed for a redundant circuit under the single-fault assumption is not necessarily a valid test set if a fault occurrence is preceded by the occurrence of some ( undetectable) redundant faults. This is an additional reason ( besides economy) for trying to eliminate certain kinds of redundancy from the circuit. However, single-fault analysis may remain valid for some types of redundancy which serve a useful purpose, such as the elimination of logic hazards in two-level circuits.
ISSN:0367-7508
DOI:10.1109/PGEC.1967.264620