A Modification of Lee's Path Connection Algorithm
It is shown that a set of diagnostic tests designed for a redundant circuit under the single-fault assumption is not necessarily a valid test set if a fault occurrence is preceded by the occurrence of some ( undetectable) redundant faults. This is an additional reason ( besides economy) for trying t...
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Veröffentlicht in: | IEEE transactions on electronic computers 1967-02, Vol.EC-16 (1), p.97-98 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | It is shown that a set of diagnostic tests designed for a redundant circuit under the single-fault assumption is not necessarily a valid test set if a fault occurrence is preceded by the occurrence of some ( undetectable) redundant faults. This is an additional reason ( besides economy) for trying to eliminate certain kinds of redundancy from the circuit. However, single-fault analysis may remain valid for some types of redundancy which serve a useful purpose, such as the elimination of logic hazards in two-level circuits. |
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ISSN: | 0367-7508 |
DOI: | 10.1109/PGEC.1967.264620 |