Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges

Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges

We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC...

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Veröffentlicht in:IEEE transactions on applied superconductivity 1995-06, Vol.5 (2), p.3369-3372
Hauptverfasser: Nguyen, T., O'Callaghan, J.M., Davidson, B.A., Redwing, R.D., Hohenwarter, G.K.G., Nordman, J.E., Beyer, J.B.
Format: Artikel
Sprache:eng
Schlagworte:
Bridge circuits
Low-frequency noise
Magnetic field measurement
Magnetic films
Magnetic noise
Noise measurement
Superconducting device noise
Transistors
Voltage
Yttrium barium copper oxide
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container_end_page 3372
container_issue 2
container_start_page 3369
container_title IEEE transactions on applied superconductivity
container_volume 5
creator Nguyen, T.
O'Callaghan, J.M.
Davidson, B.A.
Redwing, R.D.
Hohenwarter, G.K.G.
Nordman, J.E.
Beyer, J.B.
description We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage .< >
doi_str_mv 10.1109/77.403314
format Article
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Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage .&lt; &gt;</description><subject>Bridge circuits</subject><subject>Low-frequency noise</subject><subject>Magnetic field measurement</subject><subject>Magnetic films</subject><subject>Magnetic noise</subject><subject>Noise measurement</subject><subject>Superconducting device noise</subject><subject>Transistors</subject><subject>Voltage</subject><subject>Yttrium barium copper oxide</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><recordid>eNo9kD1PwzAYhC0EEqUwsDJ5ZXBrx3bsjKjiSypi6R45b143Ro0DdgLqv6eoFdOddI_upCPkVvCFELxaGrNQXEqhzshMaG1ZoYU-P3iuBbNFIS_JVc4fnAtllZ4R_4bQuRhyn6kfEoUhthOMYYj0Ozi6G36YT_g1YYQ9jUPISHt0eUrYYxwzHTztwrZjm2WeGgpLOnYhMh92Pe0DpKFJod1iviYX3u0y3px0TjZPj5vVC1u_P7-uHtYMKqmYMkYbMGAr24C1rilKYZUqK3S2tMZylBJaAyUUhitolGpbboXQrim1bUs5J_fH2sNyzgl9_ZlC79K-Frz--6c2pj7-c2DvjmxAxH_uFP4CW8BgmQ</recordid><startdate>199506</startdate><enddate>199506</enddate><creator>Nguyen, T.</creator><creator>O'Callaghan, J.M.</creator><creator>Davidson, B.A.</creator><creator>Redwing, R.D.</creator><creator>Hohenwarter, G.K.G.</creator><creator>Nordman, J.E.</creator><creator>Beyer, J.B.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>199506</creationdate><title>Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges</title><author>Nguyen, T. ; O'Callaghan, J.M. ; Davidson, B.A. ; Redwing, R.D. ; Hohenwarter, G.K.G. ; Nordman, J.E. ; Beyer, J.B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c934-47757c7c898bc88ab26184469ea868780e33cd7c6c2704cb44dd08115ab658d63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Bridge circuits</topic><topic>Low-frequency noise</topic><topic>Magnetic field measurement</topic><topic>Magnetic films</topic><topic>Magnetic noise</topic><topic>Noise measurement</topic><topic>Superconducting device noise</topic><topic>Transistors</topic><topic>Voltage</topic><topic>Yttrium barium copper oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nguyen, T.</creatorcontrib><creatorcontrib>O'Callaghan, J.M.</creatorcontrib><creatorcontrib>Davidson, B.A.</creatorcontrib><creatorcontrib>Redwing, R.D.</creatorcontrib><creatorcontrib>Hohenwarter, G.K.G.</creatorcontrib><creatorcontrib>Nordman, J.E.</creatorcontrib><creatorcontrib>Beyer, J.B.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Nguyen, T.</au><au>O'Callaghan, J.M.</au><au>Davidson, B.A.</au><au>Redwing, R.D.</au><au>Hohenwarter, G.K.G.</au><au>Nordman, J.E.</au><au>Beyer, J.B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>1995-06</date><risdate>1995</risdate><volume>5</volume><issue>2</issue><spage>3369</spage><epage>3372</epage><pages>3369-3372</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. 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subjects Bridge circuits
Low-frequency noise
Magnetic field measurement
Magnetic films
Magnetic noise
Noise measurement
Superconducting device noise
Transistors
Voltage
Yttrium barium copper oxide
title Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges
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