Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges

Mechanisms for conduction via low-frequency noise measurements of high-T/sub c/ thin-film microbridges

We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC...

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Veröffentlicht in:IEEE transactions on applied superconductivity 1995-06, Vol.5 (2), p.3369-3372
Hauptverfasser: Nguyen, T., O'Callaghan, J.M., Davidson, B.A., Redwing, R.D., Hohenwarter, G.K.G., Nordman, J.E., Beyer, J.B.
Format: Artikel
Sprache:eng
Schlagworte:
Bridge circuits
Low-frequency noise
Magnetic field measurement
Magnetic films
Magnetic noise
Noise measurement
Superconducting device noise
Transistors
Voltage
Yttrium barium copper oxide
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Zusammenfassung:We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage .< >
ISSN:1051-8223
1558-2515
DOI:10.1109/77.403314