An Application of IDD Spectrum Testing Method to the Fault Analysis

An Application of IDD Spectrum Testing Method to the Fault Analysis

IDDQ information is very useful to localize faults in a LSI. But it is time consuming to discover test vectors which induce abnormal IDDQ. Since the IDD spectrum testing method can detect abnormal supply current easily, we can acquire the test vector information in a short time by the method. An app...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Sakaguchi, K.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Current measurement
Current supplies
Electronic equipment testing
Fault detection
Fault diagnosis
Frequency
Information analysis
Large scale integration
National electric code
Time measurement
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:IDDQ information is very useful to localize faults in a LSI. But it is time consuming to discover test vectors which induce abnormal IDDQ. Since the IDD spectrum testing method can detect abnormal supply current easily, we can acquire the test vector information in a short time by the method. An application of the method is introduced and we show experimental results
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2006.261005