Exploration of Power Device Reliability using Compact Device Models and Fast Electro-Thermal Simulation

This paper presents the application of compact IGBT and PIN diode models, including features such as local lifetime control and field-stop technology, to the full electrothermal system simulation of a hybrid electric vehicle converter using a lookup table of device losses. The vehicle converter is s...

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Bibliographische Detailangaben
Hauptverfasser:	Bryant, A.T., Mawby, P.A., Palmer, P.R., Santi, E., Hudgins, J.L.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	compact modeling electro-thermal simulation Electrothermal effects Fatigue Hybrid electric vehicles Insulated gate bipolar transistors Materials reliability mission profile power semiconductor devices Power system modeling Power system reliability rainflow cycle counting Reliability Table lookup Temperature thermal cycling Vehicle driving
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