Exploration of Power Device Reliability using Compact Device Models and Fast Electro-Thermal Simulation

This paper presents the application of compact IGBT and PIN diode models, including features such as local lifetime control and field-stop technology, to the full electrothermal system simulation of a hybrid electric vehicle converter using a lookup table of device losses. The vehicle converter is simulated with an urban driving cycle (FUDS), used to generate transient device temperature profiles. A methodology is also described to explore the converter reliability using the temperature profile, with techniques from materials fatigue analysis. The effects of ambient temperature, driving style and converter design on converter reliability are also investigated