Influence of Pulsed Electromagnetic Fields Upon Integral Memory Microcircuit

Influence of Pulsed Electromagnetic Fields Upon Integral Memory Microcircuit

The experimental study method of the direct influence by pulsed electromagnetic fields on modern microcircuits of the memories is described. The field values, under which the malfunction in the microcircuits working and degradation phenomena in microstructures element of the crystal and discharge of...

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Bibliographische Detailangaben
Hauptverfasser: Ahramovich, L.N., Gribski, M.P., Grigoriev, E.V., Zuev, S.A., Starostenko, V.V., Churyumov, G.I., Borisov, A.A., Petrov, A.M.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Electromagnetic fields
EMP radiation effects
IEEE catalog
Microwave technology
Organizing
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Zusammenfassung:The experimental study method of the direct influence by pulsed electromagnetic fields on modern microcircuits of the memories is described. The field values, under which the malfunction in the microcircuits working and degradation phenomena in microstructures element of the crystal and discharge of the microcircuits begin, are obtained
DOI:10.1109/CRMICO.2006.256173