New Insights into Recovery Characteristics Post NBTI Stress

New Insights into Recovery Characteristics Post NBTI Stress

In this work, we investigate recovery characteristics post NBTI stress when the recovery bias remains negative but lower in magnitude than the stress bias, consolidating the viewpoint involving role of hole trapping during NBTI degradation. We show that successive negative recovery biases can be app...

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Bibliographische Detailangaben
Hauptverfasser: Parthasarathy, Cr, Denais, M, Huard, V., Ribes, G., Vincent, E., Bravaix, A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Current measurement
Data mining
Degradation
MOSFETs
Niobium compounds
Plasma measurements
Plasma temperature
Stress measurement
Titanium compounds
Voltage
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Beschreibung
Zusammenfassung:In this work, we investigate recovery characteristics post NBTI stress when the recovery bias remains negative but lower in magnitude than the stress bias, consolidating the viewpoint involving role of hole trapping during NBTI degradation. We show that successive negative recovery biases can be applied to view trapping and detrapping behavior explicitly
ISSN:1541-7026
1938-1891
DOI:10.1109/RELPHY.2006.251264