Si/SiGe epitaxial-base transistors. I. Materials, physics, and circuits

A detailed review of SiGe epitaxial base technology is presented, which chronicles the progression of research from materials deposition through device and integration demonstrations, culminating in the first SiGe integrated circuit application. In part I of this paper, the requirements and processe...

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Veröffentlicht in:IEEE transactions on electron devices 1995-03, Vol.42 (3), p.455-468
Hauptverfasser: Harame, D.L., Comfort, J.H., Cressler, J.D., Crabbe, E.F., Sun, J.Y.-C., Meyerson, B.S., Tice, T.
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Sprache:eng
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Zusammenfassung:A detailed review of SiGe epitaxial base technology is presented, which chronicles the progression of research from materials deposition through device and integration demonstrations, culminating in the first SiGe integrated circuit application. In part I of this paper, the requirements and processes for high-quality SiGe film preparation are discussed, with emphasis on fundamental principles. A detailed overview of SiGe HBT device design and implications for circuit applications is then presented.< >
ISSN:0018-9383
1557-9646
DOI:10.1109/16.368039