Binary vs decade inductive voltage divider comparison and error decomposition

An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVDs with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is p...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Avramov, S., Stenbakken, G.N., Koffman, A.D., Oldham, N.M., Gammon, R.W.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Matrix decomposition Noise measurement Noise reduction Parameter estimation Predictive models Redundancy Switches Testing Transformers Voltage
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