Binary vs decade inductive voltage divider comparison and error decomposition
An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVDs with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is p...
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| container_end_page | 920 vol.2 |
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| creator | Avramov, S. Stenbakken, G.N. Koffman, A.D. Oldham, N.M. Gammon, R.W. |
| description | An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVDs with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to separate errors due to binary and decade structures with a 2/spl sigma/ uncertainty of 0.05 parts per million (ppm).< > |
| doi_str_mv | 10.1109/IMTC.1994.351958 |
| format | Conference Proceeding |
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| identifier | ISBN: 9780780318809 |
| ispartof | Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9), 1994, p.917-920 vol.2 |
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| language | eng |
| recordid | cdi_ieee_primary_351958 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Matrix decomposition Noise measurement Noise reduction Parameter estimation Predictive models Redundancy Switches Testing Transformers Voltage |
| title | Binary vs decade inductive voltage divider comparison and error decomposition |
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