Picosecond time domain measurements using GaAs FET sampler
Sampling measurements in the low tens picosecond range are performed using a hybrid FET technology which incorporates the different functions i.e. sampler, sampling pulse generator, test step generator. The accuracy of measured waveforms is investigated using time domain simulations.< >
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| creator | Hafdallah, H. Ouslimani, A. Adde, R. Vernet, G. |
| description | Sampling measurements in the low tens picosecond range are performed using a hybrid FET technology which incorporates the different functions i.e. sampler, sampling pulse generator, test step generator. The accuracy of measured waveforms is investigated using time domain simulations.< > |
| doi_str_mv | 10.1109/CPEM.1994.333312 |
| format | Conference Proceeding |
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The accuracy of measured waveforms is investigated using time domain simulations.< ></description><subject>Circuit testing</subject><subject>FETs</subject><subject>Gallium arsenide</subject><subject>Integrated circuit measurements</subject><subject>Performance evaluation</subject><subject>Pulse generation</subject><subject>Pulse measurements</subject><subject>Sampling methods</subject><subject>Time measurement</subject><subject>Voltage</subject><isbn>0780319842</isbn><isbn>9780780319844</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1994</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9jj0PgjAUAF9iTPxiN079A2ILJVI3Q1AXEgZ30sDT1NBC-mDw30uis7fccMsBbAUPheDqkJV5EQqlZBhPiGgGK35MeSxUKqMFBEQvPiETIZNkCafS1B1h3bmGDcYiazqrjWMWNY0eLbqB2EjGPdlVn4ld8jsjbfsW_QbmD90SBj-vYTfV7LY3iFj13ljt39X3Iv4bP5SENYU</recordid><startdate>1994</startdate><enddate>1994</enddate><creator>Hafdallah, H.</creator><creator>Ouslimani, A.</creator><creator>Adde, R.</creator><creator>Vernet, G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1994</creationdate><title>Picosecond time domain measurements using GaAs FET sampler</title><author>Hafdallah, H. ; Ouslimani, A. ; Adde, R. ; Vernet, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_3333123</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Circuit testing</topic><topic>FETs</topic><topic>Gallium arsenide</topic><topic>Integrated circuit measurements</topic><topic>Performance evaluation</topic><topic>Pulse generation</topic><topic>Pulse measurements</topic><topic>Sampling methods</topic><topic>Time measurement</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Hafdallah, H.</creatorcontrib><creatorcontrib>Ouslimani, A.</creatorcontrib><creatorcontrib>Adde, R.</creatorcontrib><creatorcontrib>Vernet, G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hafdallah, H.</au><au>Ouslimani, A.</au><au>Adde, R.</au><au>Vernet, G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Picosecond time domain measurements using GaAs FET sampler</atitle><btitle>Proceedings of Conference on Precision Electromagnetic Measurements Digest</btitle><stitle>CPEM</stitle><date>1994</date><risdate>1994</risdate><spage>11</spage><epage>12</epage><pages>11-12</pages><isbn>0780319842</isbn><isbn>9780780319844</isbn><abstract>Sampling measurements in the low tens picosecond range are performed using a hybrid FET technology which incorporates the different functions i.e. sampler, sampling pulse generator, test step generator. 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| identifier | ISBN: 0780319842 |
| ispartof | Proceedings of Conference on Precision Electromagnetic Measurements Digest, 1994, p.11-12 |
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| language | eng |
| recordid | cdi_ieee_primary_333312 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit testing FETs Gallium arsenide Integrated circuit measurements Performance evaluation Pulse generation Pulse measurements Sampling methods Time measurement Voltage |
| title | Picosecond time domain measurements using GaAs FET sampler |
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