Picosecond time domain measurements using GaAs FET sampler

Picosecond time domain measurements using GaAs FET sampler

Sampling measurements in the low tens picosecond range are performed using a hybrid FET technology which incorporates the different functions i.e. sampler, sampling pulse generator, test step generator. The accuracy of measured waveforms is investigated using time domain simulations.< >

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Bibliographische Detailangaben
Hauptverfasser: Hafdallah, H., Ouslimani, A., Adde, R., Vernet, G.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit testing
FETs
Gallium arsenide
Integrated circuit measurements
Performance evaluation
Pulse generation
Pulse measurements
Sampling methods
Time measurement
Voltage
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Beschreibung
Zusammenfassung:Sampling measurements in the low tens picosecond range are performed using a hybrid FET technology which incorporates the different functions i.e. sampler, sampling pulse generator, test step generator. The accuracy of measured waveforms is investigated using time domain simulations.< >
DOI:10.1109/CPEM.1994.333312