Temperature and transverse mode characteristics of InGaAsP (1.3 /spl mu/m) vertical cavity lasers on GaAs substrates

We present the transverse mode and temperature characteristics of a novel InGaAsP (1.3 /spl mu/m) vertical cavity laser structure which employs a lattice mismatched GaAs/AlAs mirror and one dielectric mirror. The devices lase in a linearly polarized, single transverse mode up to 2 times threshold. T...

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Hauptverfasser: Dudley, J.J., Babic, D.I., Mirin, R., Yang, L., Miller, B.I., Hu, E.L., Bowers, J.E.
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Babic, D.I.
Mirin, R.
Yang, L.
Miller, B.I.
Hu, E.L.
Bowers, J.E.
description We present the transverse mode and temperature characteristics of a novel InGaAsP (1.3 /spl mu/m) vertical cavity laser structure which employs a lattice mismatched GaAs/AlAs mirror and one dielectric mirror. The devices lase in a linearly polarized, single transverse mode up to 2 times threshold. The characteristic temperature of 11 /spl mu/m diameter devices is 67 K at room temperature.< >
doi_str_mv 10.1109/ICIPRM.1994.328233
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ispartof Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM), 1994, p.315-318
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Bandwidth
Dielectric substrates
Etching
Fiber lasers
Gallium arsenide
Indium phosphide
Laser modes
Mirrors
Reflectivity
Temperature distribution
title Temperature and transverse mode characteristics of InGaAsP (1.3 /spl mu/m) vertical cavity lasers on GaAs substrates
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