Testability of one dimensional ILAs under multiple faults

Testability of one dimensional ILAs under multiple faults

Testing of one dimensional unilateral iterative logic arrays (ILAs) of combinational cells under multiple faults is discussed. It has been shown that it is possible to generate a test set for ILAs with primary outputs under multiple faults. Some ILAs have a constant number of test vectors independen...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Gala, M.M.R., Watson, K.L., Ross, D.E.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit faults
Circuit testing
Equations
Fault location
Logic testing
Sufficient conditions
Very large scale integration
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Beschreibung
Zusammenfassung:Testing of one dimensional unilateral iterative logic arrays (ILAs) of combinational cells under multiple faults is discussed. It has been shown that it is possible to generate a test set for ILAs with primary outputs under multiple faults. Some ILAs have a constant number of test vectors independent of the size of the array. These types of arrays are called C-testable arrays. Present work proves that all useful one dimensional unilateral ILAs with only boundary outputs are not C-testable under multiple faults.< >
DOI:10.1109/VTEST.1993.313327