Lead titanate thin films deposited by metallorganic chemical vapor deposition (MOCVD)

Highly transparent lead titanate (PbTiO/sub 3/) thin films were deposited on both platinum-coated silicon wafers and sapphire disks. The results were characterized using XRD (X-ray diffraction) to determine the phases present and the presence of preferred orientation. SEM (scanning electron microscopy) was used to examine the morphology of both the surface and the cross-section. UV-VIS-NIR (ultraviolet, visible, near infrared) spectrophotometry was used to determine the dispersion relationship and the optical band gap energy. XRD revealed a nonoriented film on sapphire while the film on the platinum substrate was preferably oriented in the