A method of test pattern generation for multiple-valued PLAs

An easy test pattern generation (ETPG) method is developed for multiple-valued programmable logic arrays (MV PLAs). The ETPG so generated can detect crosspoint faults, weight faults, and their fault positions. In comparison with binary ETPG, it is shown that the number of test vectors does not incre...

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Bibliographische Detailangaben
Hauptverfasser:	Nagata, Y., Afuso, C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Charge coupled devices Charge-coupled image sensors Fault detection Hybrid power systems Logic testing Programmable logic arrays Silicon Test pattern generators Very large scale integration Voltage
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Beschreibung
Zusammenfassung:	An easy test pattern generation (ETPG) method is developed for multiple-valued programmable logic arrays (MV PLAs). The ETPG so generated can detect crosspoint faults, weight faults, and their fault positions. In comparison with binary ETPG, it is shown that the number of test vectors does not increase as fast as the radix number of multiple-valued functions increases. The ETPG method for a product line is generalized for a total PLA testing algorithm.< >
DOI:	10.1109/ISMVL.1993.289576