A simple method for extraction of multiple quantum well absorption coefficient from reflectance and transmittance measurements

A simple model is presented which takes into account interference effects in the common three-layer p-i-n diode epitaxial structure used for measurement of electroabsorption effects in multiple quantum well material. Antireflection coatings or surface roughening are not required to extinguish Fabry-...

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Veröffentlicht in:	IEEE journal of quantum electronics 1993-10, Vol.29 (10), p.2589-2595
Hauptverfasser:	Gerber, D.S., Maracas, G.N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorption Coatings Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Fabry-Perot Gallium arsenide Iii-v semiconductors Interference Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films P-i-n diodes Physics Reflectivity Rough surfaces Semiconductor process modeling Surface roughness
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