Localization of faulty operators on an ASIC by the use of a laser beam

A powerful testing method consists in using two complementary techniques for ASIC's failure localization and analysis: external electrical testing and internal contactless laser beam testing. This method has been made possible using the CAD environment. It provides test vectors and simulation results for the electrical external tester and ASIC layout for the internal contactless laser beam tester. The use of a laser beam integrated in automatic test equipment allows the authors to determine the logic state of any operator in the ASIC. The method is based upon the photoelectric effect generated in the laser beam-silicon interaction.< >