Boundary scan with cellular-based built-in self-test

Boundary scan with cellular-based built-in self-test

Boundary scan merging with built-in self-test is discussed. The proposed implementation of boundary scan represents a snapshot of the Joint Test Advisory Group Recommendation 1.0, while the built-in self-test implements the features of cellular automata. Test patterns generated from two distinct sou...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Gloster, C.S., Brglez, F.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Automatic testing
Built-in self-test
Circuit testing
Connectors
Costs
Packaging
Pattern analysis
Pins
Registers
Test pattern generators
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Beschreibung
Zusammenfassung:Boundary scan merging with built-in self-test is discussed. The proposed implementation of boundary scan represents a snapshot of the Joint Test Advisory Group Recommendation 1.0, while the built-in self-test implements the features of cellular automata. Test patterns generated from two distinct sources are examined, one with registers using cellular automata and the other, based on the conventional LFSR (linear-feedback shift register) configuration. Distinctive effects of these patterns on fault coverage of specific designs are analyzed and illustrated.< >
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1988.207791