Using Bulk Built-in Current Sensors to Detect Soft Errors

Using Bulk Built-in Current Sensors to Detect Soft Errors

Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption

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Bibliographische Detailangaben
Veröffentlicht in:IEEE MICRO 2006-09, Vol.26 (5), p.10-18
Hauptverfasser: Neto, E.H., Ribeiro, I., Vieira, M., Wirth, G., Kastensmidt, F.L.
Format: Artikel
Sprache:eng
Schlagworte:
and Fault-Tolerance
Built-in tests
Circuit faults
Design engineering
Digital systems
Electronics
Error analysis
Error-checking
Integrated circuits
Joining
Logic devices
Monitoring
Neutrons
Power consumption
Protons
Pulse generation
Registers
Reliability
Sensors
Signal generators
Silicon
Simulation
Soft errors
SPICE
Spices
Testing
Validation studies
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Beschreibung
Zusammenfassung:Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption
ISSN:0272-1732
1937-4143
DOI:10.1109/MM.2006.103