Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit-Error-Rate Testers

Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution...

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Veröffentlicht in:IEEE photonics technology letters 2006-10, Vol.18 (19), p.2059-2061
Hauptverfasser: Kuo-Liang Chen, Wang, C., Wilks, J.
Format: Artikel
Sprache:eng
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Zusammenfassung:Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution down to a bit-error ratio (BER) of 10 -11 . This method takes advantage of the high sampling rate of modern BER testers. We found that the noise distribution for a 1310-nm Fabry-Perot laser and a 1550-nm distributed-feedback laser are well fitted by Gaussian distributions
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2006.883255