How are we going to test SoCs on a board?: the users viewpoint

How are we going to test SoCs on a board?: the users viewpoint

This article provides an overview on SoC's on board testing. It discusses the topic of life cycle perspective, efficient test required, re-use challenges, test access and control, SoC DFT architecture, test sequencing, DFT support, and debug and diagnosis support

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Bibliographische Detailangaben
1. Verfasser: Carisson, G.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Chip scale packaging
Circuit testing
Costs
Design for testability
Marketing management
Signal generators
Silicon
System testing
System-on-a-chip
Timing
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Beschreibung
Zusammenfassung:This article provides an overview on SoC's on board testing. It discusses the topic of life cycle perspective, efficient test required, re-use challenges, test access and control, SoC DFT architecture, test sequencing, DFT support, and debug and diagnosis support
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2005.1584095