Bead probes in practice

Bead probes in practice

Bead probes, a technology for in-circuit test probing of high-speed and/or high-density printed circuit boards was introduced at the 2004 International Test Conference as stated in K. P. Parker (2004). Since then much experimentation has been done with bead probe technology, and a large, high-densit...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Parker, K.P.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit testing
Copper
Fixtures
Gravity
Manufacturing
Pins
Printed circuits
Probes
Shape
Surface tension
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Beschreibung
Zusammenfassung:Bead probes, a technology for in-circuit test probing of high-speed and/or high-density printed circuit boards was introduced at the 2004 International Test Conference as stated in K. P. Parker (2004). Since then much experimentation has been done with bead probe technology, and a large, high-density board has been designed and produced that makes use of them. This paper discusses the learning from these efforts
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2005.1584024