IEEE Std 1500 Compliant Infrastructure forModular SOC Testing

Modern semiconductor process technologies enable the manufacturing of a complete system on one single die, the so-called system-on-chip or SOC. Building those chips in a timely and cost-effective manner is amongst others realized by embedding third-party IP cores. Due to imperfections in silicon man...

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Hauptverfasser:	Waayers, T., Marinissen, E.J., Lousberg, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit testing Laboratories Logic testing Manufacturing processes Marine technology Pins Semiconductor device manufacture Silicon System testing System-on-a-chip
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creator	Waayers, T. Marinissen, E.J. Lousberg, M.
description	Modern semiconductor process technologies enable the manufacturing of a complete system on one single die, the so-called system-on-chip or SOC. Building those chips in a timely and cost-effective manner is amongst others realized by embedding third-party IP cores. Due to imperfections in silicon manufacturing, an SOC including all its embedded modules needs to be tested for manufacturing defects.
doi_str_mv	10.1109/ATS.2005.67
format	Conference Proceeding
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Circuit testing Laboratories Logic testing Manufacturing processes Marine technology Pins Semiconductor device manufacture Silicon System testing System-on-a-chip
title	IEEE Std 1500 Compliant Infrastructure forModular SOC Testing
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