Threshold Voltage Model of Single Gate SOI MOSFETs Derived from Asymptotic Method
A compact model for threshold voltages of SOI MOSFETs with ultra-thin top Si layer is presented. The model is based on potential distribution solution of the two-dimensional Poisson equation using an asymptotic method. The validity of the model is verified by comparison with results of two-dimension...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | A compact model for threshold voltages of SOI MOSFETs with ultra-thin top Si layer is presented. The model is based on potential distribution solution of the two-dimensional Poisson equation using an asymptotic method. The validity of the model is verified by comparison with results of two-dimensional numerical simulations. |
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ISSN: | 1946-1569 1946-1577 |
DOI: | 10.1109/SISPAD.2005.201499 |