An automatic device to measure the thermal diffusivity of thin film materials

A new automatic apparatus based on measuring the temperature evolution at the center of the pulsed annular laser beam when the laser beam irradiates the surface of a thin film material to obtain the thermal diffusivity has been developed. The serviceability of the device has been simulated with a co...

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Bibliographische Detailangaben
Hauptverfasser:	Troitsky, O.Yu, Medvedev, V.V., Sok Won Kim
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Computational modeling Computer simulation Laser beams Optical materials Optical pulses Pulse measurements Surface emitting lasers Temperature measurement Thin film devices Transistors
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Beschreibung
Zusammenfassung:	A new automatic apparatus based on measuring the temperature evolution at the center of the pulsed annular laser beam when the laser beam irradiates the surface of a thin film material to obtain the thermal diffusivity has been developed. The serviceability of the device has been simulated with a computer. The results indicate the capability of the device to measure the thermal diffusivity.
DOI:	10.1109/KORUS.2004.1555621