Ultra-low base resistance self-aligned SEG SiGe HBTs for high-sensitivity wide-bandwidth amplifiers

To fabricate a SiGe HBT with low base resistance, a heavily boron-doped and high-Ge-content base and a high-peripheral-ratio emitter configuration were applied. To retain a high h/sub FE/ and f/sub T/ for low intrinsic/extrinsic base resistances, the Ge profile was carefully optimized. The emitter c...

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Hauptverfasser: Tominari, T., Shimamoto, H., Miura, M., Yoshida, Y., Wada, S., Takahashi, H., Arai, M., Hosoe, H., Washio, K., Hashimoto, T.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:To fabricate a SiGe HBT with low base resistance, a heavily boron-doped and high-Ge-content base and a high-peripheral-ratio emitter configuration were applied. To retain a high h/sub FE/ and f/sub T/ for low intrinsic/extrinsic base resistances, the Ge profile was carefully optimized. The emitter configuration with a high periphery-to-area ratio could be introduced through the advantage of the low parasitic capacitance in the self-aligned structure, and contributed to a further reduction of the base resistance without degradation of f/sub T/ and f/sub max/. As a result, the base resistance was successfully reduced to about 1/3 of the previous HBT.
ISSN:1088-9299
2378-590X
DOI:10.1109/BIPOL.2005.1555215