XPAD: pixel detector for material sciences

Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. The XPAD prototype, using active pixels, has been developed to fulfil the needs of materials science scattering experiments. At the time, its prototype is build of eigh...

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Veröffentlicht in:	IEEE transactions on nuclear science 2005-10, Vol.52 (5), p.1994-1998
Hauptverfasser:	Basolo, S., Berar, J.-F., Boudet, N., Breugnon, P., Caillot, B., Clemens, J.-C., Delpierre, P., Dinkespiler, B., Koudobine, I., Meessen, C., Menouni, M., Mouget, C., Pangaud, P., Potheau, R., Vigeolas, E.
Format:	Artikel
Sprache:	eng
Schlagworte:	Calibration Construction Detector Detectors Diffraction Diodes Electromagnetic scattering Instrumentation and Detectors Materials science and technology Optoelectronic and photonic sensors Particle scattering Physics pixel Pixels powder diffraction Powders Prototypes SAXS Switches synchrotron Synchrotrons
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Beschreibung
Zusammenfassung:	Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. The XPAD prototype, using active pixels, has been developed to fulfil the needs of materials science scattering experiments. At the time, its prototype is build of eight modules of eight chips. The threshold calibration of /spl ap/4 10/sup 4/ pixels is discussed. Applications to powder diffraction or SAXS experiments prove that it allows to record high quality data.
ISSN:	0018-9499 1558-1578
DOI:	10.1109/TNS.2005.856818