Long-term hermeticity and biological performance of anodically bonded glass-silicon implantable packages
This paper reviews long-term test results obtained from a series of tests on glass-silicon (Si) hermetically sealed packages. Results are presented from 1) a 9.9-year ongoing room temperature phosphate-buffered saline (PBS) soak test of four packages; 2) accelerated soak tests in high temperature sa...
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Veröffentlicht in: | IEEE transactions on device and materials reliability 2005-09, Vol.5 (3), p.458-466 |
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description | This paper reviews long-term test results obtained from a series of tests on glass-silicon (Si) hermetically sealed packages. Results are presented from 1) a 9.9-year ongoing room temperature phosphate-buffered saline (PBS) soak test of four packages; 2) accelerated soak tests in high temperature saline of 28 samples resulting in an extrapolated mean-time-to-failure (MTTF) at 37/spl deg/C of 177 years; 3) a 2.7-year in vitro 97/spl deg/C PBS soak test of a single package; and 4) in situ hermeticity and biocompatibility tests from 12 packages implanted in four guinea pigs-three packages implanted in two guinea pigs (each) for 1 month and another two guinea pigs for 20 and 22 months. All of the packages remained hermetically sealed over the lifetime of the implant. A detailed histological report of the implants is provided suggesting that they elicit no profound adverse reaction from the body. |
doi_str_mv | 10.1109/TDMR.2005.854374 |
format | Magazinearticle |
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Results are presented from 1) a 9.9-year ongoing room temperature phosphate-buffered saline (PBS) soak test of four packages; 2) accelerated soak tests in high temperature saline of 28 samples resulting in an extrapolated mean-time-to-failure (MTTF) at 37/spl deg/C of 177 years; 3) a 2.7-year in vitro 97/spl deg/C PBS soak test of a single package; and 4) in situ hermeticity and biocompatibility tests from 12 packages implanted in four guinea pigs-three packages implanted in two guinea pigs (each) for 1 month and another two guinea pigs for 20 and 22 months. All of the packages remained hermetically sealed over the lifetime of the implant. A detailed histological report of the implants is provided suggesting that they elicit no profound adverse reaction from the body.</description><identifier>ISSN: 1530-4388</identifier><identifier>EISSN: 1558-2574</identifier><identifier>DOI: 10.1109/TDMR.2005.854374</identifier><identifier>CODEN: ITDMA2</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Biocompatibility ; Biocompatible package ; Bonding ; Glass ; hermetic package ; Hermetic seals ; Implants ; in vivo testing ; Integrated circuit packaging ; microsystems packages ; Rough surfaces ; Surface roughness ; Temperature ; Testing ; Thermal management</subject><ispartof>IEEE transactions on device and materials reliability, 2005-09, Vol.5 (3), p.458-466</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c354t-4b65741ded300446f9b099f979dfc59d0117dc9568ce4b16254ada5b827077eb3</citedby><cites>FETCH-LOGICAL-c354t-4b65741ded300446f9b099f979dfc59d0117dc9568ce4b16254ada5b827077eb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1545908$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>780,784,796,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1545908$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Harpster, T.J.</creatorcontrib><creatorcontrib>Nikles, S.A.</creatorcontrib><creatorcontrib>Dokmeci, M.R.</creatorcontrib><creatorcontrib>Najafi, K.</creatorcontrib><title>Long-term hermeticity and biological performance of anodically bonded glass-silicon implantable packages</title><title>IEEE transactions on device and materials reliability</title><addtitle>TDMR</addtitle><description>This paper reviews long-term test results obtained from a series of tests on glass-silicon (Si) hermetically sealed packages. Results are presented from 1) a 9.9-year ongoing room temperature phosphate-buffered saline (PBS) soak test of four packages; 2) accelerated soak tests in high temperature saline of 28 samples resulting in an extrapolated mean-time-to-failure (MTTF) at 37/spl deg/C of 177 years; 3) a 2.7-year in vitro 97/spl deg/C PBS soak test of a single package; and 4) in situ hermeticity and biocompatibility tests from 12 packages implanted in four guinea pigs-three packages implanted in two guinea pigs (each) for 1 month and another two guinea pigs for 20 and 22 months. All of the packages remained hermetically sealed over the lifetime of the implant. A detailed histological report of the implants is provided suggesting that they elicit no profound adverse reaction from the body.</description><subject>Biocompatibility</subject><subject>Biocompatible package</subject><subject>Bonding</subject><subject>Glass</subject><subject>hermetic package</subject><subject>Hermetic seals</subject><subject>Implants</subject><subject>in vivo testing</subject><subject>Integrated circuit packaging</subject><subject>microsystems packages</subject><subject>Rough surfaces</subject><subject>Surface roughness</subject><subject>Temperature</subject><subject>Testing</subject><subject>Thermal management</subject><issn>1530-4388</issn><issn>1558-2574</issn><fulltext>true</fulltext><rsrctype>magazinearticle</rsrctype><creationdate>2005</creationdate><recordtype>magazinearticle</recordtype><sourceid>RIE</sourceid><recordid>eNp9kc1L9DAQxoso-HkXvAQP4qXrpEna5PjiN6wIoueSptM1mjY16R72vzdlhRc8eJkZZn7zMMOTZacUFpSCunq9eXpZFABiIQVnFd_JDqgQMi9ExXfnmkHOmZT72WGMHwBUVaI8yN6XfljlE4aevKeAkzV22hA9tKSx3vmVNdqREUPnQ68Hg8R3aerbue82pPFDiy1ZOR1jHq2zxg_E9qPTw6Qbh2TU5lOvMB5ne512EU9-8lH2dnf7ev2QL5_vH6__LXPDBJ9y3pTpYJo0GQDnZacaUKpTlWo7I1QLlFatUaKUBnlDy0Jw3WrRyKKCqsKGHWUXW90x-K81xqnubTTo0kHo17EuJIAsmUzg5Z8gBSaFElSqhJ7_Qj_8OgzpjVoVwKiiRZEg2EIm-BgDdvUYbK_DJinVs0X1bFE9W1RvLUorZ9sVi4j_ccGFAsm-AQbejYQ</recordid><startdate>20050901</startdate><enddate>20050901</enddate><creator>Harpster, T.J.</creator><creator>Nikles, S.A.</creator><creator>Dokmeci, M.R.</creator><creator>Najafi, K.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>7QO</scope><scope>FR3</scope><scope>P64</scope></search><sort><creationdate>20050901</creationdate><title>Long-term hermeticity and biological performance of anodically bonded glass-silicon implantable packages</title><author>Harpster, T.J. ; Nikles, S.A. ; Dokmeci, M.R. ; Najafi, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c354t-4b65741ded300446f9b099f979dfc59d0117dc9568ce4b16254ada5b827077eb3</frbrgroupid><rsrctype>magazinearticle</rsrctype><prefilter>magazinearticle</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Biocompatibility</topic><topic>Biocompatible package</topic><topic>Bonding</topic><topic>Glass</topic><topic>hermetic package</topic><topic>Hermetic seals</topic><topic>Implants</topic><topic>in vivo testing</topic><topic>Integrated circuit packaging</topic><topic>microsystems packages</topic><topic>Rough surfaces</topic><topic>Surface roughness</topic><topic>Temperature</topic><topic>Testing</topic><topic>Thermal management</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Harpster, T.J.</creatorcontrib><creatorcontrib>Nikles, S.A.</creatorcontrib><creatorcontrib>Dokmeci, M.R.</creatorcontrib><creatorcontrib>Najafi, K.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Biotechnology Research Abstracts</collection><collection>Engineering Research Database</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on device and materials reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Harpster, T.J.</au><au>Nikles, S.A.</au><au>Dokmeci, M.R.</au><au>Najafi, K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Long-term hermeticity and biological performance of anodically bonded glass-silicon implantable packages</atitle><jtitle>IEEE transactions on device and materials reliability</jtitle><stitle>TDMR</stitle><date>2005-09-01</date><risdate>2005</risdate><volume>5</volume><issue>3</issue><spage>458</spage><epage>466</epage><pages>458-466</pages><issn>1530-4388</issn><eissn>1558-2574</eissn><coden>ITDMA2</coden><abstract>This paper reviews long-term test results obtained from a series of tests on glass-silicon (Si) hermetically sealed packages. Results are presented from 1) a 9.9-year ongoing room temperature phosphate-buffered saline (PBS) soak test of four packages; 2) accelerated soak tests in high temperature saline of 28 samples resulting in an extrapolated mean-time-to-failure (MTTF) at 37/spl deg/C of 177 years; 3) a 2.7-year in vitro 97/spl deg/C PBS soak test of a single package; and 4) in situ hermeticity and biocompatibility tests from 12 packages implanted in four guinea pigs-three packages implanted in two guinea pigs (each) for 1 month and another two guinea pigs for 20 and 22 months. All of the packages remained hermetically sealed over the lifetime of the implant. A detailed histological report of the implants is provided suggesting that they elicit no profound adverse reaction from the body.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TDMR.2005.854374</doi><tpages>9</tpages></addata></record> |
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subjects | Biocompatibility Biocompatible package Bonding Glass hermetic package Hermetic seals Implants in vivo testing Integrated circuit packaging microsystems packages Rough surfaces Surface roughness Temperature Testing Thermal management |
title | Long-term hermeticity and biological performance of anodically bonded glass-silicon implantable packages |
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