Hybrid packaging technique for high power density circuit
Downsizing or miniaturizing power circuits for the 1990's power conversion technologies requires high and very high power density (greater than 100 watt/in/sup 3/) packaging capability. Among different packaging techniques, the hybrid packaging technique is preferred for many applications becau...
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creator | Ngon Binh Nguyen Jones, F.B. |
description | Downsizing or miniaturizing power circuits for the 1990's power conversion technologies requires high and very high power density (greater than 100 watt/in/sup 3/) packaging capability. Among different packaging techniques, the hybrid packaging technique is preferred for many applications because it has a good reliability history. This technique utilizes newly developed processes and materials such as direct bonded copper and diamond coated substrates to significantly improve thermal management and achieve optimal thermal resistance (less than 0.4 degrees C/watt). A 124 watt/cm/sup 2/ (800 watt/in/sup 2/) power density hybrid packaging example is presented here. The results of thermal design and evaluation of this hybrid are discussed.< > |
doi_str_mv | 10.1109/STHERM.1991.152922 |
format | Conference Proceeding |
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Among different packaging techniques, the hybrid packaging technique is preferred for many applications because it has a good reliability history. This technique utilizes newly developed processes and materials such as direct bonded copper and diamond coated substrates to significantly improve thermal management and achieve optimal thermal resistance (less than 0.4 degrees C/watt). A 124 watt/cm/sup 2/ (800 watt/in/sup 2/) power density hybrid packaging example is presented here. The results of thermal design and evaluation of this hybrid are discussed.< ></description><identifier>ISBN: 0879426640</identifier><identifier>ISBN: 9780879426644</identifier><identifier>DOI: 10.1109/STHERM.1991.152922</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bonding ; Copper ; Electronic packaging thermal management ; Power conversion ; Power dissipation ; Switches ; Switching circuits ; Temperature ; Thermal management ; Thermal resistance</subject><ispartof>1991 Proceedings, Seventh IEEE Semiconductor Thermal Measurement and Management Symposium, 1991, p.105-109</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/152922$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/152922$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Ngon Binh Nguyen</creatorcontrib><creatorcontrib>Jones, F.B.</creatorcontrib><title>Hybrid packaging technique for high power density circuit</title><title>1991 Proceedings, Seventh IEEE Semiconductor Thermal Measurement and Management Symposium</title><addtitle>STHERM</addtitle><description>Downsizing or miniaturizing power circuits for the 1990's power conversion technologies requires high and very high power density (greater than 100 watt/in/sup 3/) packaging capability. Among different packaging techniques, the hybrid packaging technique is preferred for many applications because it has a good reliability history. This technique utilizes newly developed processes and materials such as direct bonded copper and diamond coated substrates to significantly improve thermal management and achieve optimal thermal resistance (less than 0.4 degrees C/watt). A 124 watt/cm/sup 2/ (800 watt/in/sup 2/) power density hybrid packaging example is presented here. The results of thermal design and evaluation of this hybrid are discussed.< ></description><subject>Bonding</subject><subject>Copper</subject><subject>Electronic packaging thermal management</subject><subject>Power conversion</subject><subject>Power dissipation</subject><subject>Switches</subject><subject>Switching circuits</subject><subject>Temperature</subject><subject>Thermal management</subject><subject>Thermal resistance</subject><isbn>0879426640</isbn><isbn>9780879426644</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1991</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tKw0AYRgdEUGtfoKt5gcT555bMUko1QkXQui5z-ScZL2mcpEje3kL9Nmd3OB8hK2AlADN3b7tm8_pcgjFQguKG8wtyw-rKSK61ZFdkOY4f7DSpQBtzTUwzu5wCHaz_tG3qWzqh7_r0c0QaD5l2qe3ocPjFTAP2Y5pm6lP2xzTdkstov0Zc_nNB3h82u3VTbF8en9b32yJBxadCW-9EMIEH1CgwRBG9t7UM8RTElRfM1cxa56UOykWroJaghKq5hBgqLRZkdfYmRNwPOX3bPO_P58QfSYZGbw</recordid><startdate>1991</startdate><enddate>1991</enddate><creator>Ngon Binh Nguyen</creator><creator>Jones, F.B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1991</creationdate><title>Hybrid packaging technique for high power density circuit</title><author>Ngon Binh Nguyen ; Jones, F.B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-6acb3d9d2de6e3edf3fcca84df66425c30b80aabc46d5bfa518415358241fd763</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Bonding</topic><topic>Copper</topic><topic>Electronic packaging thermal management</topic><topic>Power conversion</topic><topic>Power dissipation</topic><topic>Switches</topic><topic>Switching circuits</topic><topic>Temperature</topic><topic>Thermal management</topic><topic>Thermal resistance</topic><toplevel>online_resources</toplevel><creatorcontrib>Ngon Binh Nguyen</creatorcontrib><creatorcontrib>Jones, F.B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ngon Binh Nguyen</au><au>Jones, F.B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Hybrid packaging technique for high power density circuit</atitle><btitle>1991 Proceedings, Seventh IEEE Semiconductor Thermal Measurement and Management Symposium</btitle><stitle>STHERM</stitle><date>1991</date><risdate>1991</risdate><spage>105</spage><epage>109</epage><pages>105-109</pages><isbn>0879426640</isbn><isbn>9780879426644</isbn><abstract>Downsizing or miniaturizing power circuits for the 1990's power conversion technologies requires high and very high power density (greater than 100 watt/in/sup 3/) packaging capability. Among different packaging techniques, the hybrid packaging technique is preferred for many applications because it has a good reliability history. This technique utilizes newly developed processes and materials such as direct bonded copper and diamond coated substrates to significantly improve thermal management and achieve optimal thermal resistance (less than 0.4 degrees C/watt). A 124 watt/cm/sup 2/ (800 watt/in/sup 2/) power density hybrid packaging example is presented here. The results of thermal design and evaluation of this hybrid are discussed.< ></abstract><pub>IEEE</pub><doi>10.1109/STHERM.1991.152922</doi><tpages>5</tpages></addata></record> |
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identifier | ISBN: 0879426640 |
ispartof | 1991 Proceedings, Seventh IEEE Semiconductor Thermal Measurement and Management Symposium, 1991, p.105-109 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Bonding Copper Electronic packaging thermal management Power conversion Power dissipation Switches Switching circuits Temperature Thermal management Thermal resistance |
title | Hybrid packaging technique for high power density circuit |
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