A new approach to implement a defect tolerant power distribution network in WSI circuits

A new approach to implement a defect tolerant power distribution network in WSI circuits

An efficient approach for implementing a defect-tolerant power distribution network suitable for WSI (wafer scale integration) circuits is proposed. The network is not segmented but relies on a thermal imaging technique for defect localization and laser cutting for defect isolation. Power bus design...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Yung, M.W., Little, M.J.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit testing
Image segmentation
Infrared imaging
Intelligent networks
Joining processes
Liquid crystals
Optical imaging
Power lasers
Power supplies
Power systems
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Beschreibung
Zusammenfassung:An efficient approach for implementing a defect-tolerant power distribution network suitable for WSI (wafer scale integration) circuits is proposed. The network is not segmented but relies on a thermal imaging technique for defect localization and laser cutting for defect isolation. Power bus designs for this approach are described. Preliminary, experimental results have verified the design concepts.< >
DOI:10.1109/ICWSI.1991.151718