SWIFT: a testbed with optically switched data paths for computing applications

SWIFT: a testbed with optically switched data paths for computing applications

This paper reports the implementation of SWIFT, designed to enable testing of novel network architecture for optical interconnects, optical devices, and real world applications. We describe the design and implementation of the testbed using semisynchronous timing and multiple wavelength striping.

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Bibliographische Detailangaben
Hauptverfasser: Glick, M., Dales, M., McAuley, D., Tao Lin, Williams, K., Penty, R., White, I.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Bandwidth
Computer applications
Integrated circuit interconnections
Optical buffering
Optical computing
Optical design
Optical devices
Optical fiber networks
Optical interconnections
Testing
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Beschreibung
Zusammenfassung:This paper reports the implementation of SWIFT, designed to enable testing of novel network architecture for optical interconnects, optical devices, and real world applications. We describe the design and implementation of the testbed using semisynchronous timing and multiple wavelength striping.
ISSN:2162-7339
DOI:10.1109/ICTON.2005.1506091