Performance and Reliability of High Density Flash EEPROMs under CHISEL Programming Operation

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Mahapatra, S., Shukuri, S., Bude, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Automatic testing Channel hot electron injection Character generation Degradation Electronics EPROM Exact sciences and technology Impact ionization Integrated circuit reliability Integrated circuit technology Integrated circuits Integrated circuits by function (including memories and processors) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Threshold voltage Velocity measurement
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:
DOI:	10.1109/ESSDERC.2002.194941