Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices

The Monte Carlo method is used to evaluate the extent of the crosstalk in solid-state imagers. The calculations are performed in three dimensions and are in excellent agreement with experiment. The Monte Carlo method is used because it handles adjacent regions that either collect or reflect minority...

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Veröffentlicht in:	IEEE transactions on electron devices 1985-10, Vol.32 (10), p.2087-2091
Hauptverfasser:	Lavine, J.P., Win-Chyi Chang, Anagnostopoulos, C.N., Burkey, B.C., Nelson, E.T.
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Sprache:	eng
Schlagworte:	Applied sciences Display Electronics Exact sciences and technology
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container_title	IEEE transactions on electron devices
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creator	Lavine, J.P. Win-Chyi Chang Anagnostopoulos, C.N. Burkey, B.C. Nelson, E.T.
description	The Monte Carlo method is used to evaluate the extent of the crosstalk in solid-state imagers. The calculations are performed in three dimensions and are in excellent agreement with experiment. The Monte Carlo method is used because it handles adjacent regions that either collect or reflect minority carriers.
doi_str_mv	10.1109/T-ED.1985.22243
format	Article
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subjects	Applied sciences Display Electronics Exact sciences and technology
title	Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices
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