Device physics of TRAPATT oscillators

This paper utilizes a simplified physical model to describe TRAPATT (TRApped Plasma Avalanche Triggered Transit) operation. By yielding on computational accuracy, a complete high-efficiency device design is generated and the dependence of operation on physical parameters is elucidated. The extreme complexity of the precise differential equations describing TRAPATT operation has made the calculation of a single diode-circuit configuration a tour de force. However, by observing the important features of such a solution, a simplified approach giving realistic answers has been evolved. A theoretical device design has been evolved. This design provides device width and impurity density as a function of TRAPATT frequency, and indicates a decreasing degree of "reach through" with increasing frequency. In addition, the explicit dependence of width and impurity density on the diode's reverse saturation current has been obtained. The launching of the avalanche zone through the diode, and, in particular, the limitations implicit in the recovery to a swept-out state, are of broad significance in other types of diodes, particularly p-i-n switches and "snap" diodes.