Transistor noise at low temperatures

It is shown that the shot noise theory of transistors holds for low temperatures in alloy junction transistors, provided that the effect of hole-electron pair recombination in the emitter transition region is taken into account. The discrepancy between theory and experiment reported by Lee and Kamin...

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Veröffentlicht in:IEEE transactions on electron devices 1964-02, Vol.11 (2), p.50-53
Hauptverfasser: Bruncke, W.C., Chenette, E.R., van der Ziel, A.
Format: Artikel
Sprache:eng
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Zusammenfassung:It is shown that the shot noise theory of transistors holds for low temperatures in alloy junction transistors, provided that the effect of hole-electron pair recombination in the emitter transition region is taken into account. The discrepancy between theory and experiment reported by Lee and Kaminsky can be accounted for by the fact that this process was ignored.
ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1964.15282