Methods of detecting contaminants on electron device components

Methods of detecting contaminants on electron device components

The need for test methods contaminant studies and control of parts processing is reviewed, with major emphasis on tests which are simple, nondestructive, and sensitive.

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Bibliographische Detailangaben
Veröffentlicht in:I.R.E. transactions on electron devices 1957-04, Vol.4 (2), p.190-190
1. Verfasser: Feder, D.O.
Format: Artikel
Sprache:eng
Schlagworte:
Electron tubes
Image color analysis
Pollution measurement
Seals
Sensitivity
Telephone sets
Water
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Beschreibung
Zusammenfassung:The need for test methods contaminant studies and control of parts processing is reviewed, with major emphasis on tests which are simple, nondestructive, and sensitive.
ISSN:0096-2430
2379-8661
DOI:10.1109/T-ED.1957.14248