High resolution fourier synthesis hard X-ray imaging based on CdTe strip detectors

Employing Fourier-synthesis optics and one-dimensional position-sensitive detectors, we are developing a novel hard X-ray imager which can work in the ~10 keV to ~200 keV range either as a telescope or a microscope. As the detection part of our imager, we have developed a strip detector made of Scho...

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Hauptverfasser: Miyawaki, R., Niko, H., Okada, Y., Kokubun, M., Makishima, K., Negoro, H., Kotoku, J., Terada, Y., Tanaka, T., Mitani, T., Nakazawa, K., Takahashi, T., Ohno, R., Funaki, M., Kuroda, Y., Genba, K., Onishi, M.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:Employing Fourier-synthesis optics and one-dimensional position-sensitive detectors, we are developing a novel hard X-ray imager which can work in the ~10 keV to ~200 keV range either as a telescope or a microscope. As the detection part of our imager, we have developed a strip detector made of Schottky CdTe diode, with its cathode divided into 64 channels of 150 mum pitch. Electrodes of all channels are gold-stud bonded to a fanout board, and connected to low noise analog ASIC. We read out signals from all channels simultaneously. As the grid optics elements, one-dimensional modulation collimator grids of 1 mm thick tungsten have been manufactured, with 10 grid pitches ranging from 0.2 mm to 2 mm with harmonic ratios. Combining the CdTe strip detector and the modulation collimators, we have verified hard X-ray imaging performance of this system. Specifically, by observing an 241 Am source, we have successfully obtained an image in the 10-70 keV range
ISSN:1082-3654
2577-0829
DOI:10.1109/NSSMIC.2004.1466859